Miriam Mayonado- Del Pilar
Address: 47 Villa Santiago St. Balite Malolos Bulacan
Contact No: -/-
Email Ad: -
Objective: To impart my knowledge and have a career growth in my field of specialization.
Education: B.S Electronics and Communication Engineering
1994 – 1999 Rizal Technological University
Boni Avenue, Mandaluyong City
Experience:
Sunlife Grepa Financial Inc. ( Licensed Financial Advisor) Oct. 05,2016- present
Life Insurance Company
Assist client in their Financial Planning in Life insurance and investment.
Quality Control (Final Visual Inspection) Sub-Leader March 01, 2011 – April 15,2012
JX-Nippon Mining & Metals Philippines. Inc.
Manufacturing of Electro Deposited Copper Foil
Act as a shift Leader, Handle production line monitoring.
Notify Production on deviations in process by updating the results of inspection.
FVI Judgment of outgoing products through APC system.
Contribute in meeting TPM activity targets. Conduct training to subordinates.
Quality Inspector (Final Visual Inspection) May 17, 2004 –February 28, 2011 Nikko Metals Philippines. Inc.
Manufacturing of Electro Deposited Copper Foil
Perform visual inspection to detect physical property defects of finished product.
Ensure compliance with correct handling procedures and inspection materials.
Work closely with production personnel by communicating and providing timely inspection results.
Conduct Analysis of defect through Scanning Electron Microscope for more accurate result.
Nippon Mining & Metals Co. Ltd. Shirogane Works Hitachi City,Japan
March 14, 2006 - June 9, 2006 November 13, 2007 – December 26, 2007
October 22, 2006 - December 21, 2006 March 8, 2008 – May 1, 2008
March 13, 2007 - May 10, 2007 July 18, 2008 – September 12, 2008
July 18, 2007 - September 13.2007 October 31, 2008 – December 23,2008
Developing Inspection guidelines and Improvement Process through analysis of defects.
Failure Analysis Technician March 22.2004- May 17, 2004
PSI Technologies Laguna
Semiconductor
Product electrical analysis using Final Test machine and curve tracer.
Perform product decapsulation and Product analysis after decapsulation such as die etching and back etching.
Perform X-ray, SAM, and Cross-sectional on product submitted for further analysis.
Quality Inspector(In process & Gate Inspection) Nov. 8, 1999 - March 11, 2002
Fastech MicroAssembly & Test Inc.
Semiconductor
Check if process operation conforms to correct product,processing,procedures,material requirement, and machine process parameter setting as specified in the applicable procedure & instruction.
Stops production if necessary to correct quality problems.
Ensures that right sampling plan and inspection method are applied during inspection following applicable quality procedure and instruction.
Software: MS Office 2007, MS Outlook, Internet Explorer
Knows how to Ion Sputter Fettest 9300B
Operate the ff. Curve Tracer X-ray Machine
Equipments: Low Power Microscope High Power Microscope
Tesec Tester (Test 906HT) CSAM Equipment
Scanning Electron Microscope
Cross-sectional equipment
Personal Data: Nickname: Mia
Birthdate: March 25, 1978
Status: Married
References available upon request
